Fotolia Laser Party

Specialist for Laser Photonics & Nanotechnology

SIOS high precision thickness measurement

High precision thickness measurements using tactile probes

Our partner SIOS Messtechnik GmbH is announcing a new webinar

Date: 08. March 2022
Time: 08:30 CET or 15:30 CET

The general trend towards precision, miniaturization and automation in industry and research places high demands on precision measuring systems. These should accurately measure the geometric dimensions of objects. The webinar “High precision thickness measurements using tactile probes” will address this topic.

Hereby, the highly precise one-dimensional measurement of the thickness of precision objects is a special application. Specifically designed setups based on tactile probes are able to detect the thickness with measurement uncertainties in the 10 nm range. Examples are gauge block comparators or setups for the measurement of precision optics or silicon wafers thickness.

In our approx. 45 min webinar you will gain insight into issues around the high precision measurement of the thickness of extended objects using tactile probes.
Starting with the discussion of typical influences and contributions to the measurement uncertainty, we compare different principles of equipment for this tactile length measurements.
We introduce the SIOS interferometrical tactile probes LM 20 and LM 50 and discuss their benefits compared to other high precision probes.Furthermore, application examples of high precision thickness measurements such as the SIOS gauge block comparator, the lens- or wafer-thickness measurement setups are discussed.

Finally, we present examples how existing (tactile) length and thickness measurement setups can be upgraded with interferometers to increase their resolution and precision.

At a glance:

  • Geometrical definition of thickness
  • Principles for tactile thickness measurement
  • Influences and contributions to the measurement uncertainty
  • SIOS interferometrical tactile probes LM 20 and LM 50
  • Application example
    • gauge block comparator
    • lens thickness measurement setup
    • wafer thickness measurement setup
  • Upgrade of existing length and thickness measurement setup with interferometers

Feel free to visit the webinar archive


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