The joint CEA-CNRS team used a 20 years old diffractometer to study nanostructures on surfaces during their growth. A more powerful synchrotron diffractometer machine made by Symétrie was chosen.
The new synchrotron diffractometer performs 2 main functions:
- Sample positioning: the sample is adjusted on the beam trajectory and can move in 6 degrees of freedom, thanks to a BREVA hexapod, to adjust the angle of incidence of the beam.
- Detector positioning: to gather the diffracted X-rays characterizing the crystallographic structure of the sample, a detector moves freely on a spherical surface around the sample
Project specifications
- Easy access to the UHV chamber
- Arm detector angular speed: 20°/s
- Sphere of confusion sample: 50 μm
- Sphere of confusion detector: 100 μm
- BREVA hexapod resolution: 1 μm, 0.001°