Fotolia Laser Party

Specialist for Laser Photonics & Nanotechnology

Symetrie Diffractometer

More powerful synchrotron diffractometer machine made by Symétrie

The joint CEA-CNRS team used a 20 years old diffractometer to study nanostructures on surfaces during their growth. A more powerful synchrotron diffractometer machine made by Symétrie was chosen.
The new synchrotron diffractometer performs 2 main functions:

  • Sample positioning: the sample is adjusted on the beam trajectory and can move in 6 degrees of freedom, thanks to a BREVA hexapod, to adjust the angle of incidence of the beam.
  • Detector positioning: to gather the diffracted X-rays characterizing the crystallographic structure of the sample, a detector moves freely on a spherical surface around the sample
Project specifications
  • Easy access to the UHV chamber
  • Arm detector angular speed: 20°/s
  • Sphere of confusion sample: 50 μm
  • Sphere of confusion detector: 100 μm
  • BREVA hexapod resolution: 1 μm, 0.001°